News

12.08 세미나

Author
isd
Date
2016-12-15 12:39
Views
294

12.08(목) 세미나 19:00~21:00

세미나 주제:

  1. Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement : root cause detection에 대하여
  2. Akaike Information Criterion(AIC), Bayesian information Criterion(BIC)

발표자: 윤휘건, 장재연